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2. Charge storage and distribution in the nitride layer of Metal-Nitride-Oxide Semiconductor structures;Kapoor;J. Appl. Phys.,1981
3. Improved retention and cycling characteristics of MONOS memory using charge-trapping engineering;Chin,2009
4. Extremely low voltage and high speed deep trapping MONOS memory with good retention;Chin,2006
5. A critical review of charge trapping NAND flash devices;Lue,2008