A HIERARCHICAL ITEM RESPONSE MODEL FOR EDUCATIONAL TESTING

Author:

Bock R. Darrell,Mislevy Robert J.

Publisher

Elsevier

Reference19 articles.

1. Marginal maximum likelihood estimation of item parameters: An application of an EM algorithm;Bock;Psychometrika,1981

2. Bock, R.D., Cook, L., & Pfeiffenberger, W., (1985). Detecting and modeling item parameter drift. Paper presented at the 50th anniversary meeting of the Psychometric Society, Nashville, TN.

3. An item response curve model for matrix-sampling data: The California Grade 3 assessment;Bock,1981

4. Adaptive EAP estimation of ability in a microcomputer environment;Bock;Applied Psychological Measurement,1982

5. The next stage in educational assessment;Bock;Educational Researcher,1982

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