A time-of-flight atom-probe field-ion microscope for the study of defects in metals
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference14 articles.
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1. Three-Dimensional Atom-Probe Tomography: Advances and Applications;Annual Review of Materials Research;2007-08-01
2. Perspective: From field-ion microscopy of single atoms to atom-probe tomography: A journey: “Atom-probe tomography” [Rev. Sci. Instrum. 78, 031101 (2007)];Review of Scientific Instruments;2007-03
3. Ultrahigh-resolution chemical analysis with the atom probe;International Materials Reviews;1987-01
4. Atomic resolution observations of solute-atom segregation effects and phase transitions in stacking faults in dilute cobalt alloys—I. Experimental results;Acta Metallurgica;1985-08
5. SOLUTE-ATOM SEGREGATION AND TWO-DIMENSIONAL PHASE TRANSITIONS IN STACKING FAULTS : AN ATOM-PROBE FIELD-ION MICROSCOPE STUDY;Le Journal de Physique Colloques;1985-04
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