X-ray characterization of amorphous multilayers-Reference-Cited by-同舟云学术

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X-ray characterization of amorphous multilayers

Published:1986-04 Issue:4 Volume:20 Page:443-450
ISSN:0036-9748
Container-title:Scripta Metallurgica
language:en
Short-container-title:Scripta Metallurgica

Author:

Kadin A.M.,Keem J.E.

Publisher

Elsevier BV

Subject

General Engineering

Reference18 articles.

1. Proc. SPIE,1985

2. Layered synthetic microstructures as Bragg diffractors for X rays and extreme ultraviolet: theory and predicted performance

3. Synthetic Multilayered Structures;Greer,1985

4. Proc. SPIE;Takagi,1985

Cited by 24 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Morphology and tribological properties of metal (oxide)–MoS2 nanostructured multilayer coatings;Surface and Coatings Technology;1998-06

2. X‐ray scattering from nonideal multilayer structures: Calculations in the kinematical approximation;Journal of Applied Physics;1995-02

3. Evolution of structural and magnetic properties in Ta/Ni81Fe19multilayer thin films;Journal of Applied Physics;1993-07

4. Structural and tribological studies of MoS2 solid lubricant films having tailored metal-multilayer nanostructures;Surface and Coatings Technology;1992-07

5. Characterization of as‐prepared and annealed W/C multilayer thin films;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1992-01

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