Electrical resistivity and structural relaxation in Fe75TM5B20 amorphous alloys (TM = Ti, V, Cr, Mn, Co, Ni)-Reference-Cited by-同舟云学术

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Electrical resistivity and structural relaxation in Fe75TM5B20 amorphous alloys (TM = Ti, V, Cr, Mn, Co, Ni)

Published:1984-01 Issue:1 Volume:18 Page:13-17
ISSN:0036-9748
Container-title:Scripta Metallurgica
language:en
Short-container-title:Scripta Metallurgica

Author:

Riontino G,Marino F

Publisher

Elsevier BV

Subject

General Engineering

Reference13 articles.

1. Metallic glasses

2. STRUCTURAL RELAXATION IN METALLIC GLASSES

3. Structural relaxation and irreversible changes of electrical resistivity of Fe‐Ni‐Mo‐B amorphous alloys

4. A. Lucci et al., to be published.

5. Compositional dependence of crystallization temperature of Fe80−xMxB20 glasses

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