Tapping-mode scanning force microscopy: Metallic tips and samples-Reference-Cited by-同舟云学术

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Tapping-mode scanning force microscopy: Metallic tips and samples

Published:1996-04 Issue:4 Volume:5 Page:291-297
ISSN:0927-0256
Container-title:Computational Materials Science
language:en
Short-container-title:Computational Materials Science

Author:

Sarid Dror

Publisher

Elsevier BV

Subject

Computational Mathematics,General Physics and Astronomy,Mechanics of Materials,General Materials Science,General Chemistry,General Computer Science

Reference29 articles.

1. Atomic Force Microscope

2. Force microscopy

3. Atomic Force Microscopy

4. Scanning Force Microscopy;Sarid,1991

5. Scanning Force Microscopy;Sarid,1994

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3. Bias-controlled friction of InAs nanowires on a silicon nitride layer studied by atomic force microscopy;Physical Review B;2010-07-02

4. Conductive-atomic force microscopy characterization of Ta2O5/SiO2stacks and the effect of microwave irradiation;Journal of Physics D: Applied Physics;2009-06-23

5. Calibration of atomic force microscope cantilevers using piezolevers;Review of Scientific Instruments;2007

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