Texture of MBE grown Cr films on α-Al2O3(0001): the occurrence of Nishiyama-Wassermann (NW) and Kurdjumov-Sachs (KS) related orientation relationships
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Ceramics and Composites
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1. Enhancement of Thermal Conductance at Metal-Dielectric Interfaces Using Subnanometer Metal Adhesion Layers;Physical Review Applied;2016-01-26
2. Cr(110) texture induced by epitaxy on Al2O3(0001) substrates: Preferential grain growth in the 〈001〉 direction;Applied Physics Letters;2013-04-08
3. Growth and electronic structure of Sm on thin Al2O3/Ni3Al(111) films;The Journal of Chemical Physics;2012-04-21
4. Application of coincidence of reciprocal lattice point model to metal/sapphire hetero interfaces;Materials Science and Engineering: B;2010-10
5. Resonant impurity scattering and electron-phonon scattering in the electrical resistivity of Cr thin films;Physical Review B;2009-10-29
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