Fundamental parameters approach in the Rietveld method: a study of the stability of results versus the accuracy of the instrumental profile
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Ceramics and Composites
Reference41 articles.
1. X-ray Procedures for Polycrystalline and Amorphous Materials;Klug,1974
2. The quantitative calculation of SiC polytypes from measurements of X-ray diffraction peak intensities;Ruska;J. Mater. Sci.,1979
3. Polytype distribution in silicon carbide;Frevel;J. Mater. Sci.,1992
4. A profile refinement method for nuclear and magnetic structures;Rietveld;J. Appl. Cryst.,1969
5. The Rietveld method in neutron and X-ray powder diffraction;Albinati;J. Appl. Cryst.,1982
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