Effect of magnetic film thickness on rectifying properties of La0.8Sr0.2MnO3/TiO2 heterostructures
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
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1. Magnetic and electrical transport properties of La 0.7 Sr 0.3 MnO 3 /LaFeO 3 bilayer thin films;Journal of Magnetism and Magnetic Materials;2017-11
2. Rectifying Properties of La1-XSrXMnO3/Si (x=0.2, 0.04) PN Heterostructures;Advanced Materials Research;2011-12
3. Effects of ZnO film thickness on electrical and magnetoresistance characteristics of La0.8Sr0.2MnO3/ZnO heterostructures;Journal of Magnetism and Magnetic Materials;2010-09
4. Fabrication, characterization, and the rectifying properties of the interfacial structural controlled LaSrMnO–Si heterojunctions;Journal of Applied Physics;2008-01
5. Semiconductor spintronics;Acta Physica Slovaca. Reviews and Tutorials;2007-08-01
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