Thickness dependence of structural, magnetic properties and reversal mechanism of Co–Cr–Ta/Cr longitudinal recording media-Reference-Cited by-同舟云学术

Thickness dependence of structural, magnetic properties and reversal mechanism of Co–Cr–Ta/Cr longitudinal recording media

Published:2002-04 Issue: Volume:242-245 Page:395-397
ISSN:0304-8853
Container-title:Journal of Magnetism and Magnetic Materials
language:en
Short-container-title:Journal of Magnetism and Magnetic Materials

Author:

Kim P.L.,Lodder J.C.

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. Phan Le Kim, Cock Lodder, Nguyen Hoang Luong, Than Duc Hien, Proceedings of the Second International Workshop on Materials Science Hanoi—IWOMS’95, 1995, p. 299.

2. The influence of tantalum content in relation to substrate temperature on magnetic and structural properties of Co–Cr–Ta thin films

3. Texture formation and magnetic properties of RF sputtered CoCrTa/Cr longitudinal thin films

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