Dependence of the substrate structure and the film growth at the junction of YBCO SEJ rf-SQUIDs on the IBE process and effects on the SQUID's characteristics-Reference-Cited by-同舟云学术

Dependence of the substrate structure and the film growth at the junction of YBCO SEJ rf-SQUIDs on the IBE process and effects on the SQUID's characteristics

Published:2002-08 Issue: Volume:372-376 Page:240-244
ISSN:0921-4534
Container-title:Physica C: Superconductivity
language:en
Short-container-title:Physica C: Superconductivity

Author:

Fardmanesh M.,Schubert J.,Akram R.,Banzet M.,Zander W.,Zhang Y.,Schilling M.,Krause H.-J.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Energy Engineering and Power Technology,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. SQUID Sensors: Fundamentals, Fabrication and Applications, NATO ASI Series;Braginski,1996

2. 1/f noise characteristics of SEJ Y-Ba-Cu-O rf-SQUIDs on LaAlO/sub 3/ substrate and the step structure, film, and temperature dependence

3. Fabrication and characterisation of YBCO single grain boundary step edge junctions

4. High T/sub c/ dc SQUID utilizing bicrystal junctions with 30 degree misorientation angle

5. Magnetic field behavior of YBCO step-edge Josephson junctions in rf-washer SQUIDs

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