Structural investigations of sputter deposited thin films: reflection mode EXAFS, specular and non specular X-ray scattering
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference21 articles.
1. The influence of deposition temperature on the electrical resistance of thin Cu films
2. Adsorption and reaction of carbon dioxide on pure and alkali-metal promoted cold-deposited copper films
3. X-ray reflection and diffuse scattering from sputtered gold films
4. X-ray absorption;Koningsberger,1988
5. Surface Studies of Solids by Total Reflection of X-Rays
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