Interface roughness in Ni/Ti multilayers as probed by neutrons
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. C.F. Majkrzak, J.L. Wood (Ed.), SPIE Proceedings Vol. 1738, (1992).
2. I. Anderson, P. Høghøj, Annual Report of the Institute of Laue-Langevin, Grenoble, France, 1996, p. 84.
3. Mechanical and structural properties of Ni/Ti multilayers and films: An application to neutron supermirrors
4. Discrete thin-film multilayer design for X-ray and neutron supermirrors
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