Identification of arsenic antisite defects with EL2 by nanospectroscopic studies of individual centers
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference17 articles.
1. Deep Centers in Semiconductors;Martin,1986
2. Photoelectric memory effect in GaAs
3. Theoretical Evidence for an Optically Inducible Structural Transition of the Isolated As Antisite in GaAs: Identification and Explanation ofEL2?
4. Metastability of the Isolated Arsenic-Antisite Defect in GaAs
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