Digital twin-assisted interpretable transfer learning: A novel wavelet-based framework for intelligent fault diagnostics from simulated domain to real industrial domain
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Published:2024-10
Issue:
Volume:62
Page:102681
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ISSN:1474-0346
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Container-title:Advanced Engineering Informatics
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language:en
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Short-container-title:Advanced Engineering Informatics
Author:
Li ShengORCID,
Jiang Qiubo,
Xu YadongORCID,
Feng Ke,
Zhao Zhiheng,
Sun Beibei,
Huang George Q.