Bayesian inference for the simple step-stress accelerated life tests under order-restriction

Author:

Wiedner Crystal,Han David

Publisher

Elsevier BV

Subject

Artificial Intelligence,Industrial and Manufacturing Engineering

Reference17 articles.

1. Order restricted inference for exponential step-stress models;Balakrishnan;IEEE Transactions on Reliability,2009

2. Optimal step-stress testing for progressively Type-I censored data from exponential distribution;Balakrishnan;Journal of Statistical Planning and Inference,2009

3. A tampered failure rate model for step-stress accelerated life test;Bhattacharyya;Communications in Statistics-Theory and Methods,1989

4. Bayesian estimation and optimal designs in partially accelerated life testing;DeGroot;Naval Research Logistics,1979

5. Bayesian Analysis of a Simple Step-Stress Model Under Weibull Lifetimes;Ganguly;IEEE Transactions on Reliability,2015

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