An Auto-weighting FWI Fuzzy Collaborative Intelligence Approach for Forecasting DRAM Yield
Author:
Publisher
Elsevier BV
Subject
Artificial Intelligence,Industrial and Manufacturing Engineering
Reference38 articles.
1. Wafer-edge yield engineering in leading-edge DRAM manufacturing;Yavas;Semiconductor Fabtech.,2009
2. Yield learning curve models in semiconductor manufacturing;Tirkel;IEEE Transactions on Semiconductor Manufacturing,2013
3. An innovative yield learning model considering multiple learning sources and learning source interactions;Chen;Computers & Industrial Engineering,2019
4. A fuzzy set approach for yield learning modeling in wafer manufacturing;Chen;IEEE Transactions on Semiconductor Manufacturing,1999
5. A heterogeneous fuzzy collaborative intelligence approach for forecasting the product yield;Chen;Applied Soft Computing.,2017
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