Simultaneous tests for patterned recognition using nonparametric partially sequential procedure-Reference-Cited by-同舟云学术

Simultaneous tests for patterned recognition using nonparametric partially sequential procedure

Published:2008-11 Issue:6 Volume:5 Page:535-551
ISSN:1572-3127
Container-title:Statistical Methodology
language:en
Short-container-title:Statistical Methodology

Author:

Bandyopadhyay Uttam,Mukherjee Amitava,Purkait Barendra

Publisher

Elsevier BV

Subject

Statistics and Probability

Reference21 articles.

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4. Nonparametric partial sequential tests for patterned alternatives in multi-sample problems;Bandyopadhyay;Sequential Analysis,2007

5. Controlling the false discovery rate: A practical and powerful approach to multiple testing;Benjamini;Journal of Royal Statistical Society,1995

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