Laser-induced breakdown spectroscopy (LIBS) combined with hyperspectral imaging for the evaluation of printed circuit board composition-Reference-Cited by-同舟云学术

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Laser-induced breakdown spectroscopy (LIBS) combined with hyperspectral imaging for the evaluation of printed circuit board composition

Published:2015-03 Issue: Volume:134 Page:278-283
ISSN:0039-9140
Container-title:Talanta
language:en
Short-container-title:Talanta

Author:

Carvalho Rodrigo R.V.,Coelho Jomarc A.O.,Santos Jozemir M.,Aquino Francisco W.B.,Carneiro Renato L.,Pereira-Filho Edenir R.

Funder

Conselho Nacional de Desenvolvimento Científico e Tecnológico, CNPq

São Paulo Research Foundation (FAPESP)

Publisher

Elsevier BV

Subject

Analytical Chemistry

Reference20 articles.

1. Chemical hazards associated with treatment of waste electrical and electronic equipment

2. How are WEEE doing? A global review of the management of electrical and electronic wastes

3. Recycling of WEEE: Characterization of spent printed circuit boards from mobile phones and computers

4. Analysis of waste electrical and electronic equipment (WEEE) using laser induced breakdown spectroscopy (LIBS) and multivariate analysis

5. Microwave-Assisted Sample Combustion: A Technique for Sample Preparation in Trace Element Determination

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1. Elemental characterization of electronic waste: a review of research methodologies and applicability to the practice of e-waste recycling;Waste Management;2024-10

2. Analysis of slag chemistry in WEEE smelting using experimental and modelling study of the “CuO0.5”-ZnO-FeO-FeO1.5-CaO-SiO2-AlO1.5 system in equilibrium with Cu metal;Ceramics International;2024-08

3. Development of laser-induced breakdown spectroscopy based spectral tandem technology: A topical review;TrAC Trends in Analytical Chemistry;2024-08

4. Drivers and Pathways for the Recovery of Critical Metals from Waste‐Printed Circuit Boards;Advanced Science;2024-06-05

5. PCB-Vision: A Multiscene RGB-Hyperspectral Benchmark Dataset of Printed Circuit Boards;IEEE Sensors Journal;2024-05-15

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