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Large-Scale Metrology – An Update

  • Published:2002 Issue:2 Volume:51 Page:587-609
  • ISSN:0007-8506
  • Container-title:CIRP Annals
  • language:en
  • Short-container-title:CIRP Annals

Author:

Estler W.T.,Edmundson K.L.,Peggs G.N.,Parker D.H.

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Mechanical Engineering

Reference133 articles.

1. Large-Scale Metrology;Puttock;Ann. CIRP,1978

2. Handbook of Optics;Bass,1995

3. Geodetic Refraction: Effects of Electromagnetic Wave Propagation Through the Atmosphere;Brunner,1984

4. Shirley, L. G., 1999, Self-compensation of atmospheric refraction errors in optical metrology, Proc. ASPE 1999 Annual Meeting, Monterey, CA.

5. A solution to atmospherically induced problems in very high-accuracy alignment and leveling;Huiser;J. Phys. D: Appl. Phys.,1989

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