Industrial Uses of STM and AFM * *Contribution of the National Institute of Standards and Technology. Not subject to copyright except for illustrations taken from other sources.-Reference-Cited by-同舟云学术

Industrial Uses of STM and AFM * *Contribution of the National Institute of Standards and Technology. Not subject to copyright except for illustrations taken from other sources.

Published:1997 Issue:2 Volume:46 Page:597-620
ISSN:0007-8506
Container-title:CIRP Annals
language:en
Short-container-title:CIRP Annals

Author:

Vorburger T.V.,Dagata J.A.,Wilkening G.,Lizuka K.,Thwaite E.G.,Lonardo P.

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Mechanical Engineering

Reference172 articles.

1. Atomic Force Microscope;Binnig;Phys. Rev. Lett,1986

2. Workshop Summary Report: Industrial Applications of Scanned Probe Microscopy (IASPM);Dagata,1994

3. Summary Report: Second Workshop on IASPM;Dagata,1995

4. 1996 Technical Program, Third Workshop on IASPM Gaithersburg, MD, USA 2 3 May

5. 1997 Technical Program, Fourth Workshop on IASPM Gaithersburg, MD, USA 6 8 May

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