Orientation imaging microscopy: application to the measurement of grain boundary structure-Reference-Cited by-同舟云学术

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Orientation imaging microscopy: application to the measurement of grain boundary structure

Published:1993-07 Issue:1-2 Volume:166 Page:59-66
ISSN:0921-5093
Container-title:Materials Science and Engineering: A
language:en
Short-container-title:Materials Science and Engineering: A

Author:

Adams Brent L.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference18 articles.

1. Automatic analysis of electron backscatter diffraction patterns

2. Recrystallization '90;Juul-Jensen,1991

3. N. C. K. Lassen, K. Conradsen and D. Juul-Jensen, submitted to Scanning Microsc. Int.

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