1. Electromigration—A brief survey and some recent results
2. A resistometric method to characterize electromigration at the wafer level
3. Scorzoni, A., de Munari, I., Stulens, H. and D'Haeger, V. J. Appl. Phys., in press
4. De Schepper, L., De Ceuninck, W., Vanhecke, B., Beyne, E., Roggen, J. and Stals, L. M. In Proc. ESA Electronic Components Conf. ESTEC, Noordwijk, 1990, p. 133
5. De Ceuninck, W., Manca, J., D'Haeger, V., De Schepper, L. and Stals, L. M. In Proc. ESREF'95, Bordeaux, 1995, p. 177