Author:
Buck A.,Jones B.K.,Pollock H.M.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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4. Measurement of the electrical properties of electromigration specimens;Jones;Rev. Sci. Instrum.,1995
5. Microscopic Measurements of Electromigration Damage using Electrical Measurements;Jones,1995
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6 articles.
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