Analog circuit fault diagnosis based on noise measurement-Reference-Cited by-同舟云学术

Analog circuit fault diagnosis based on noise measurement

Published:1999-08 Issue:8 Volume:39 Page:1293-1298
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Dai Yisong,Xu Jiansheng

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference17 articles.

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3. A nonlinear L1 optimization algorithm for design modeling and diagnosis of network;Bander;IEEE Trans. CAS,1987

4. Analog fault diagnosis based on ramping power supply current signature clusters;Somayajula;IEEE Trans. Circuits and Systems II: Analog and Digital Signal Processing,1996

5. Electrical noise as a measure of quality and reliability in electronic devices;Jones;Advances in Electronics and Electron Physics,1993

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