Characterization of interfacial thermal resistance by acoustic micrography imaging-Reference-Cited by-同舟云学术

Characterization of interfacial thermal resistance by acoustic micrography imaging

Published:2000-03 Issue:3 Volume:40 Page:465-476
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Haque Shatil,Lu Guo-Quan,Goings J.,Sigmund J.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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