Author:
Song Chung-Kun,Choi Pun-Jae
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference17 articles.
1. HBT power devices and circuits;Bayraktaroglu;Solid-State Electronics,1997
2. GaAlAs/GaAs heterojunction bipolar transistors: issues and prospects for applications;Asbeck;IEEE Trans. Electron. Devices,1989
3. Long-term base current instability in AlGaAs/GaAs HBTs: physical mechanisms, modeling, and SPICE simulation;Liou;Microelectronics Reliability,1998
4. Nakajima O, Ito H, Nagata K. Current induced degradation of Be-doped AlGaAs/GaAs HBT's and its suppression by Zn diffusion into extrinsic base layer, 1990 Tech. Dig. IEDM. 1990;673.
5. Thermal conversion of AlxGa1−xAl layers grown by molecular beam epitaxy;Adachi;Appl. Phys. Lett.,1987
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