Accelerated dielectric breakdown and wear out standard testing methods and structures for reliability evaluation of thin oxides-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Accelerated dielectric breakdown and wear out standard testing methods and structures for reliability evaluation of thin oxides

Published:1999-05 Issue:5 Volume:39 Page:597-613
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Ghibaudo G,Pananakakis G,Kies R,Vincent E,Papadas C

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference42 articles.

1. Degradation and breakdown of silicon dioxide films on silicon

2. Statistics of extremes;Gumbel,1958

3. Vincent E. PhD thesis, INPG Grenoble, 1996

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A non-defect precursor gate oxide breakdown model;Journal of Applied Physics;2023-06-16

2. MNOS stack for reliable, low optical loss, Cu based CMOS plasmonic devices;Optics Express;2012-06-04

3. Reliability characterization of stress-induced charge trapping in HfO2 by electrostatic discharge impulse stresses;Journal of Applied Physics;2009-05-15

4. Dielectric breakdown mechanisms in gate oxides;Journal of Applied Physics;2005-12-15

5. OXIDE WEAROUT, BREAKDOWN, AND RELIABILITY;International Journal of High Speed Electronics and Systems;2001-09

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP