Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology
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Published:2002-09
Issue:9-11
Volume:42
Page:1359-1363
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ISSN:0026-2714
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Container-title:Microelectronics Reliability
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language:en
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Short-container-title:Microelectronics Reliability
Author:
Petersen R.,De Ceuninck W.,D’Haen J.,D’Olieslager M.,De Schepper L.,Vendier O.,Blanck H.,Pons D.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials