Author:
Forster S.,Lequeu T.,Jérisian R.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. 3-D analysis of the breakdown localized defects of ACS™ through a TRIAC study;Forster;Microelectron. Reliab.,2000
2. Operation of power semiconductors under transient thermal conditions: thermal fatigue reliability and mechanical aspects;Forster;Microelectron. Reliab.,2001
3. Understanding di/dt ratings and life expectancy for thyristors;Somos;Power Convers. Intell. Motion,1986
4. Aloisi P. Failure diagnosis in medium power semiconductor. EPE’91, Firenze, vol. 3. p. 117–9
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