Issues concerning charged device model ESD verification modules − the need to move to alumina-Reference-Cited by-同舟云学术

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Issues concerning charged device model ESD verification modules − the need to move to alumina

Published:2001-03 Issue:3 Volume:41 Page:407-415
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Henry L.G.,Kelly M.A.,Diep T.,Barth J.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. Henry LG, Kelly M. Disclosure to ESD Association device testing committee CDM working group WG-5.3.1. 1996, 1997 and 1998

2. ESD association draft standard for electrostatic discharge (ESD) sensitivity testing – charged device model (CDM) – non-socketed mode – component level, EOS/ESD-DS5.3.1-1996.

3. JEDEC field-induced charged device model (FCDM) test method for electrostatic discharge (ESD) withstand thresholds of microelectronic components, JESD22-C101, 1995

4. Henry LG, Hyatt H, Barth J, Stevens M, Diep T. Charged device model (CDM) metrology: limitations and problems. EOS/ESD Symp. Proc. 1996;EOS-18:167–79

5. High bandwidth transient capture, Technical application note. Pittsfield, MIA, Tektronix Publication, 1991

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