Author:
Delseny C,Pénarier A,Pascal F,Jarrix S.G,Llinares P
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. Neil S, Rozeau O, Ailloud L, Hernandez C, Llinares P, Guillermet M, Kirtsch J, Monroy A, de Poncharra J, Auvert G, Blanchard B, Mouis M, Vincent G, Chantre A. IEDM Tech Dig 1997:807–10
2. Noise as a diagnostic tool for quality and reliability of electronic devices
3. Jones BK. In: Bareikis V, Katilius R, editors. Proceedings of the 13th International Conference on Noise in Physical Systems and 1/f Fluctuations. Palanga. 1995, p. 573–8
4. A 30-GHz f/sub T/ quasi-self-aligned single-poly bipolar technology
5. Noise correlation measurements in bipolar transistors. I. Theoretical expressions and extracted current spectral densities
Cited by
11 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献