1. Fryer PM, Colgan EC, Galligan E, Graham W, Horton R, Hunt D, Latzko K, Nywening R, Jenkins L, John R, Koke P, Kuo Y, Libsch F, Lien A, Lovas I, Polastre R, Rothwell ME, Souk J, Wilson J, Wisnieff R, Wright S. SID Int Symp Dig Tech Papers, 1996. p. 333
2. Self-passivated copper gates for amorphous silicon thin-film transistors
3. Tsujimura T, Kitahara H, Makita A, Fryer F, Batey J. Int Displ Res Conf, 1996. p. 142
4. Kim CW, Jeong CO, Song HS, Kim YS, Kim JH, Choi JH, Hur MK, Yang HG, Souk JH. SID Int Symp Dig Tech Papers, 1996. p. 337
5. Hayashi M, Inoue K, Noumi S, Sakata K, Takeguchi T, Morita T, Eguchi T. SID Int Symp Dig Tech Papers, 1997. p. 885