IGBT Power modules thermal characterization : what is the optimum between a low current - high voltage or a high current - low voltage test condition for the same electrical power?
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Published:2003-09
Issue:9-11
Volume:43
Page:1901-1906
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ISSN:0026-2714
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Container-title:Microelectronics Reliability
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language:en
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Short-container-title:Microelectronics Reliability
Author:
Azzopardi S.,Woirgard E.,Vinassa J.-M.,Briat O.,Zardini C.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials