Author:
Anderson W.T,Roussos J.A,Mittereder J.A,Ioannou D.E,Moglestue C
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. Anderson WT, Roussos JA, Christianson KA. GaAs MMIC reliability studies. Quality and Reliability Engineering International 1992;8:295–300. EIA, January 1993
2. Guidelines for GaAs MMIC and FET Life Testing. JEDC PUBLICATION JEP118
3. Tobias PA, Trindade D. Applied reliability. New York: Van Nostrand Reinhold, 1986, pp. 96–101
4. Mittereder JA, Roussos JA, Anderson WT, Ioannou DE. A novel method for quantitatively measuring the channel temperature of GaAs devices for reliable life-time prediction. IEEE Transactions on Reliability, in press
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