Noise as a tool for non-destructive testing of single-crystal silicon solar cells-Reference-Cited by-同舟云学术

Noise as a tool for non-destructive testing of single-crystal silicon solar cells

Published:2001-12 Issue:12 Volume:41 Page:1947-1952
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Chobola Z

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. Low frequency noise predicts when a transistor will fail;Van der Ziel;Electronics,1966

2. 1/f noise as a reliability estimation for solar cells;Vandamme;Solid-State Electron,1983

3. Savelli M, Lecoy G, Dinet D, Renard J, Sauvage D. 1/f noise as a quality criterion for electronic devices and its measurement in automatic testing. AET Conf Session 4, 1984. p. 1–27

4. 1/f noise in GaAs Schottky diodes;Sikula;Phys Stat Sol (a),1984

5. Electrical noise as a measure of reliability in electronic devices;Jones;Adv Electron Electron Phys,1994

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