Advanced IGBT modules for railway traction applications: Reliability testing-Reference-Cited by-同舟云学术

Advanced IGBT modules for railway traction applications: Reliability testing

Published:1998-06 Issue:6-8 Volume:38 Page:1319-1323
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Berg H.,Wolfgang E.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Brite EuRam BE 95-2105 RAPSDRA: Reliability of Advanced Power Semiconductors for Railway Traction Applications

2. Material Requirements for High Voltage, High Power IGBT devices;Zehringer,1998

3. Reliability Testing and Analysis of IGBT-Power Semiconductor Modules;Jacob,1994

4. Malberti, P.; Ciappa, M.; Cattomio, R.: A Power-Cycling-Induced Failure Mechanism of IGBT Multichip Modules

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