Computer-aided prediction and analysis of electron and x-ray diffraction patterns-Reference-Cited by-同舟云学术

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Computer-aided prediction and analysis of electron and x-ray diffraction patterns

Published:1991-12 Issue:4 Volume:27 Page:213-221
ISSN:1044-5803
Container-title:Materials Characterization
language:en
Short-container-title:Materials Characterization

Author:

Steele James K.,Biederman Ronald R.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference6 articles.

1. Elements of X-ray Diffraction;Cullity,1978

2. Electron Microscopy of Materials, An Introduction;Von Heimendahl,1980

3. Conduction of Electricity Through Gasses;Thomson,1928

4. The Optical Principles of the Diffraction of X-Rays;James,1958

5. Electron Microscopy of Thin Crystals;Hirsch,1977

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Characterization of Un-stabilized Orthorhombic Zirconia Synthesized at Ambient Temperature and Pressure;MRS Proceedings;2012

2. Effect of process conditions on phase mixtures of sol–gel-synthesized nanoscale orthorhombic, tetragonal, and monoclinic zirconia;Journal of Materials Science;2010-05-01

3. Visualization techniques for molecular dynamics;IEEE Computer Graphics and Applications;1995

4. Powder Diffraction Pattern Simulation and Analysis;Advances in X-Ray Analysis;1994

5. Powder Diffraction Pattern Simulation and Analysis;Advances in X-ray Analysis;1993

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