Physical macromodelling of the dynamic behaviour of CMOS VLSI circuits: Part I

Author:

Bafleur M.,Buxo J.,Teixeira J.P.,Teixeira I.C.

Publisher

Elsevier BV

Subject

General Engineering

Reference23 articles.

1. Modeling MOS VLSI circuits for transient analysis;Subramaniam;IEEE J. Solid State Circuits,1986

2. Macromodeling and optimization of digital MOS VLSI circuits;Matson;IEEE Trans. CAD,1986

3. A timing model for static CMOS gates;Chen,1989

4. Polynomial delay models for optimization-based transistor sizing in digital CMOS VLSI circuits;Hoppe,1989

5. An accurate and efficient delay time modeling for MOS logic circuits using polynomial approximation;Jun;IEEE Trans. CAD,1989

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Dynamic fault test and diagnosis in digital systems using multiple clock schemes and multi-VDD test;11th IEEE International On-Line Testing Symposium;2005

2. Logical modelling of delay degradation effect in static CMOS gates;IEE Proceedings - Circuits, Devices and Systems;2000-04

3. Logical modelling of delay degradation effect in static CMOS gates;IEE Proceedings - Circuits, Devices and Systems;2000

4. Physical macromodelling of the dynamic behaviour of CMOS VLSI circuits: Part II;Microelectronics Journal;1992-12

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