Preparation of BiSrCaCuO thin films by atomic layer-by-layer molecular-beam-epitaxy and high-resolution transmission electron microscopy analysis of the film/substrate interface and of growth defects
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials
Reference6 articles.
1. Molecular beam epitaxial growth of layered Bi-Sr-Ca-Cu-O compounds
2. In-situ growth of Bi-Sr-Ca-Cu-O films by shutter-controlled molecular beam epitaxy
3. High resolution transmission electron microscopy study of interface structures and growth defects in epitaxial Bi2Sr2Can−1CunO4+2n + δ films on SrTiO3 and LaAlO3
4. The phase equilibria of Bi2Sr2Ca2Cu3O10 in the system Bi2O3SrOCaOCuO
5. Surface topography and bulk structure of Bi2Sr2CaCu2O8+δ films observed by scanning tunneling microscopy and high-resolution transmission electron microscopy
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Thermodynamic growth model of single crystal Bi-2212 whisker;Physica C: Superconductivity;2012-12
2. Thermodynamic parameters of Bi2Sr2CaCu2O8+δ thin film prepared by molecular beam epitaxy;Applied Surface Science;2011-09
3. Critical parameters in the molecular beam epitaxy growth of Bi2Sr2Can-1CunOyand (Sr, Ca)mCunOysuperconductor thin films;Superconductor Science and Technology;1999-01-01
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