Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network-Reference-Cited by-同舟云学术

Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network

Published:2022-11 Issue: Volume:206 Page:117731
ISSN:0957-4174
Container-title:Expert Systems with Applications
language:en
Short-container-title:Expert Systems with Applications

Author:

López de la Rosa Francisco^ORCID,Gómez-Sirvent José L.^ORCID,Sánchez-Reolid Roberto^ORCID,Morales Rafael,Fernández-Caballero Antonio^ORCID

Funder

H2020

Agencia Estatal de Investigacion

Electronic Components and Systems for European Leadership

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Science Applications,General Engineering

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