A neural-network approach for an automatic LED inspection system

Author:

Chen Wen-Chin,Hsu Shou-Wen

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Science Applications,General Engineering

Reference17 articles.

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3. A neural-network approach to recognize defect spatial pattern in semiconductor fabrication;Chen;IEEE Transactions on Semiconductor Manufacturing,2000

4. LOGIC product yield analysis by Wafer Bin Map pattern recognition supervised neural network;Chen;IEEE International Symposium on Semiconductor Manufacturing,2003

5. Neural network in detecting the change of process mean value and variance;Cheng;Journal of the Chinese Institute of Industrial Engineers,1995

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