Stitching defect detection and classification using wavelet transform and BP neural network

Author:

Wong W.K.,Yuen C.W.M.,Fan D.D.,Chan L.K.,Fung E.H.K.

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Science Applications,General Engineering

Reference31 articles.

1. Amet, A. L., Ertuzun, A., & Ercil, A. (1998), Texture defect detection using subband domain co-occurrence matrices. In IEEE southwest symposium on image analysis and interpretation (pp. 205–210).

2. Texture segmentation using wavelet transform;Arivazhagan;Pattern Recognition Letters,2003

3. Multichannel texture analysis using localized spatial filters;Bovik;IEEE Transactions on Pattern Analysis and Machine Intelligence,1990

4. Texture analysis and classification with tree-structured wavelet transform;Chang;IEEE Transactions on Image Process,1993

5. Fabric defect detection by Fourier analysis;Chan;IEEE Transactions on Industry Applications,2000

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