Controlling over-adjusted process means and variances using VSI cause selecting control charts

Author:

Yang Su-Fen,Chen Wan-Yun

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Science Applications,General Engineering

Reference21 articles.

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2. An application of variable sampling interval control charts;Baxley;Journal of Quality Technology,1996

3. Variable sampling intervals for multiparameter Shewhart charts;Chengular;Communications in Statistics – Theory and Methods,1989

4. Introduction to stochastic process;Cinlar,1975

5. Economic adjustment design for X¯ control charts;Collani;IIE Transaction,1994

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5. Using a new VSI EWMA average loss control chart to monitor changes in the difference between the process mean and target and/or the process variability;Applied Mathematical Modelling;2013-09

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