Securing RFID systems conforming to EPC Class 1 Generation 2 standard

Author:

Yeh Tzu-Chang,Wang Yan-Jun,Kuo Tsai-Chi,Wang Sheng-Shih

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Science Applications,General Engineering

Cited by 72 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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