Constructing a yield model for integrated circuits based on a novel fuzzy variable of clustered defect pattern-Reference-Cited by-同舟云学术

Constructing a yield model for integrated circuits based on a novel fuzzy variable of clustered defect pattern

Published:2012-02 Issue:3 Volume:39 Page:2856-2864
ISSN:0957-4174
Container-title:Expert Systems with Applications
language:en
Short-container-title:Expert Systems with Applications

Author:

Lin Jun-Shuw

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Science Applications,General Engineering

Reference27 articles.

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4. The use and evaluation of yield models in integrated circuit manufacturing;Cunningham;IEEE Transactions on Semiconductor Manufacturing,1990

5. Ant colony system: a cooperative learning approach to the traveling salesman problem;Dorigo;IEEE Transactions on Evolutionary Computation,1997

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