Linearity and noise evaluation based analysis of extended source heterojunction double gate tunnel FET
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Published:2024-10
Issue:
Volume:194
Page:207939
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ISSN:2773-0123
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Container-title:Micro and Nanostructures
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language:en
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Short-container-title:Micro and Nanostructures
Author:
Singh SheetalORCID,
Wairya Subodh