Analysis on image features for a standard edge by using polarization indirect microscopic system

Author:

Wang WeizeORCID,De La Rue Richard M.,Yadav N.P.,Shen Zhe,Cao Yun,Liu Juan,Liu XuefengORCID,Xu Bin

Funder

111 Project, Research Fund for International Young Scientists Grant

Jiangsu Postdoc Research Fund Grant

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. Characterization of graphene layers using super resolution polarization parameter indirect microscopic imaging;Liu;Opt. Express,2014

2. Subwavelength far field imaging of nanoparticles with parametric indirect microscopic imaging;Ullah;ACS Photonics,2018

3. The research on microscopic super Resolution using Point spread function variation induced by incident polarization change;Zhou,2014

4. RMB identification based on polarization parameters inversion imaging;Liu;8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro-and Nano-Optical Devices and Systems; and Smart Structures and Materials,2016

5. Analysis on morphological and structural features of graphene layers by using polarization indirect microscopic imaging system;Liu;International Conference on Optical Instruments and Technology 2015,2015

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