Fractal and statistical characterization of Ti thin films deposited by RF-magnetron sputtering: The effects of deposition time
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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3. Optimization of sputtered zirconium thin films as an infrared reflector for use in spectrally-selective solar absorbers;Usmani;Thin Solid Films,2017
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