Corrigendum to “A low-cost optical inspection system for rapid surface roughness measurements of CrCN hard films” [Optik 124 (14) (2013) 1902–1906]
Author:
Kuo Chil-Chyuan,Chen Yi-Ruei,Tong Cheng-Yi,Lee Jyh-Wei
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials